Title : Development of an algorithm and a program for processing signals from the profilometric sensor
Abstract:
It is known that the magnitude of micronanogeometric parameters of surface irregularities significantly affects the quality of industrial products, that is, the totality of properties that determine the ability of these products to meet certain requirements of state standards. These properties, called operational properties, include endurance, durability, vibroresistance, corrosion resistance, rigidity, accuracy, static and dynamic imperviousness, aesthetics, etc.
That is, the most important economic problem of the optimal management of the efficiency and quality of industrial products can be solved by managing exploitation indicators through optimization and continuous operational control of micronanogeometric parameters. To solve this problem, staff at the SMPE «Micron» created a nano-tech science- intensive basic measurement complex – «Profile-04» for the on-line diagnostics of micronanogeometric parameters (roughness) work surfaces of various parts during their
making, exploitation or repairing.
One the main stages of this project is creating of the profilometrical smart-piezosensor fundamentally new design type "plug and produce" with the creation mathematical software (of algorithms and computer codes) for processing signals coming from this sensor.
To computerize the first domestic profilometer introduced by the staff SMPE «Micron» at the «Electrotyazhmash» plant, the mentioned employees, under the agreement with this plant also developed a special profiloadapter that has ready-made programs for analog-to- digital conversion signal of the profilometer in any mode and its further processing using developed algorithm on any computer.
The Profile-04 algorithm to program consists of the following main sections:
? — «Components»; B — «Distortions»; C — «Correction»; D — «Parameters».
To implement the developed algorithm, the organization of data in a computer was thought out, i.e. what kind namely variables, arrays, structures will correspond to the designations used in this algorithm, what auxiliary arrays are needed, etc.
In other words, the algorithm before programming itself was first modeled in the MathCAD system, and also recorded by a pseudo-code in the form of a structural-functional block-scheme of the algorithm using the programming terms "cycle", "branching", etc.
For example, when developing pseudo-code using the so-called step-by-step drill-down method, the record it turns out much more convenient for subsequent programming and joint
complex debugging.
The algorithm under consideration has a continuation in the form of optimization, in order to minimize the errors and time of calculating the micronanogeometric parameters of the real surfaces being processed, to obtain maximum correspondence of the results of calculations these parameters with roughness samples, to expand the number of calculated standard and various industry, departmental, factory and other parameters, as well as to perform auxiliary functions: «Statistics», «Abbot curve», «Increase-decrease» (zoom),
«Print», «Help» and the like, in both automatic both and manual modes.
Thus, we plan to continue the modernization of the first domestic analogue profilometer-profilograph to the level of the corresponding microprocessor nanotechnology for resuscitation of its full-fledged production.
