An atomic force microscope (AFM) is a nanoscale imaging tool used to visualize the physical properties of a sample at the nanometer scale. It works by scanning a sharp tip, known as a cantilever, across the sample's surface. The cantilever is sensitive to forces on the nanoscale, allowing the AFM to measure the topography, electrical properties, and mechanical properties of the sample. AFMs are used in a wide range of nanotechnology applications, including materials science, life sciences, semiconductor characterization, and nanofabrication. In materials science, AFMs are used to study the mechanical properties of materials such as elasticity, hardness, and adhesion. In life sciences, AFMs can be used to analyze biological samples such as cells, viruses, and proteins. In semiconductor characterization, AFMs can be used to measure the electrical properties of transistors and other nanoscale components. Finally, AFMs can be used to fabricate nanoscale structures such as transistors and photonic crystals. The AFM is a powerful tool for characterizing the properties of nanoscale structures. Its high resolution and sensitivity make it an invaluable tool for scientists and engineers working in the field of nanotechnology.
Thomas J Webster
Hebei University of Technology, United States
Hossein Hosseinkhani
Innovation Center for Advanced Technology, Matrix, Inc., United States
Hai Feng Ji
Drexel University, United States
Paulo Cesar De Morais
Catholic University of Brasilia, Brazil
Azzedine Bensalem
Long Island University, United States
Robert Buenker
Wuppertal University, Germany
Rafal Kozubski
Jagiellonian University in Krakow, Poland
Sylwia Wcislik
Kielce University of Technology, Poland
Raman Singh
Monash University-Clayton Campus, Australia
Michael I Tribelsky
Moscow State University, Russian FederationSubmit your abstract Today
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