Metrological traceability at the nanoscale is the ability to trace a measurement to a reference standard, ensuring accuracy and reliability in measurement. This is essential for scientific research, industrial and commercial applications, and for regulatory compliance. At the nanoscale, metrological traceability is a difficult task due to the small size of the objects being measured and the complexity of the measurement process. For example, when measuring a nanoscale object, the accuracy of the measurement is affected by the size of the object, the properties of the environment, and the resolution of the measuring device. In addition, the measurement process itself may be affected by the presence of contaminants, such as dust, or the temperature and humidity of the environment. In order to ensure the accuracy of measurements at the nanoscale, metrological traceability relies on a combination of techniques, including calibration, validation, and cross-validation. Calibration involves comparing the measurement results to a known reference standard, while validation involves verifying that the measurement is accurate and reliable. Cross-validation involves repeating the measurement several times to ensure accuracy. Metrology at the nanoscale is also complicated by the lack of reliable reference standards.
Thomas J Webster
Hebei University of Technology, United States
Hossein Hosseinkhani
Innovation Center for Advanced Technology, Matrix, Inc., United States
Hai Feng Ji
Drexel University, United States
Paulo Cesar De Morais
Catholic University of Brasilia, Brazil
Azzedine Bensalem
Long Island University, United States
Robert Buenker
Wuppertal University, Germany
Rafal Kozubski
Jagiellonian University in Krakow, Poland
Sylwia Wcislik
Kielce University of Technology, Poland
Raman Singh
Monash University-Clayton Campus, Australia
Michael I Tribelsky
Moscow State University, Russian FederationSubmit your abstract Today
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