Scanning Electron Microscopy

Scanning electron microscopy (SEM) is an imaging technique used to observe the surface of a specimen at a very high magnification. SEM works by directing a focused beam of electrons onto the sample and then measuring the electrons that are scattered off of the specimen. These scattered electrons are then used to create an image of the surface of the sample. SEM can achieve a much higher resolution than optical microscopes, allowing researchers to observe features at nanometer-scale resolutions. In addition, SEM can be used to image features in three dimensions, allowing researchers to visualize the structure of their specimen in much greater detail than traditional optical microscopy. SEM is a useful tool for many applications in the scientific community. It can be used to analyze the surface topography of materials, detect contaminants on the surface, and observe specific features of a specimen. SEM is especially useful for observing the microstructure of materials, as it can be used to detect submicroscopic features such as cracks and pores. SEM is also widely used in the semiconductor industry for inspecting the quality of integrated circuits and other electronic components. Additionally, SEM can be used to observe the morphology of cells and other biological specimens. SEM is also a powerful tool for material characterization. For example, it can be used to determine the elemental composition of a sample, since the electrons scattered from the sample depend on the type of elements present. In addition, SEM can be used to measure the size, shape, and distribution of particles on a sample surface.