Tiny Testing is a nanotechnology-based technique used to measure the electrical properties of very small samples. It involves the use of scanning electron microscopy (SEM) to measure the current flowing through nanoscale objects and materials. Tiny Testing is a powerful tool for characterizing the electrical properties of nanoscale materials and devices, such as transistors, nanowires, and quantum dots. The technique works by placing a sample on a SEM stage and then applying a voltage across the sample. This voltage causes current to flow through the sample, and the current can then be measured using a variety of detection methods. These methods include secondary-electron and backscatter-electron imaging, as well as current-sensing modes such as scanning Kelvin probe microscopy (SKPM). Tiny Testing can measure current-voltage curves, current-temperature curves, and other electrical properties. Tiny Testing is particularly useful for detecting subtle changes in electrical properties caused by environmental conditions or the presence of defects. In addition, the technique can be used to measure the electrical properties of very small samples, such as individual nanowires and transistors. This makes Tiny Testing a valuable tool for characterizing nanoscale materials and devices.
Thomas J Webster
Hebei University of Technology, United States
Hossein Hosseinkhani
Innovation Center for Advanced Technology, Matrix, Inc., United States
Hai Feng Ji
Drexel University, United States
Paulo Cesar De Morais
Catholic University of Brasilia, Brazil
Azzedine Bensalem
Long Island University, United States
Robert Buenker
Wuppertal University, Germany
Rafal Kozubski
Jagiellonian University in Krakow, Poland
Sylwia Wcislik
Kielce University of Technology, Poland
Raman Singh
Monash University-Clayton Campus, Australia
Michael I Tribelsky
Moscow State University, Russian FederationSubmit your abstract Today
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